Changeset 104195 in vbox for trunk/src/VBox/VMM/testcase

Timestamp:

Apr 5, 2024 2:45:23 PM (13 months ago)

Author:

vboxsync

svn:sync-xref-src-repo-rev:

162624

Message:

VMM/IEM: Refactoring assembly helpers to not pass eflags by reference but instead by value and return the updated value (via eax/w0) - first chunk: ADD,ADC,SUB,SBB,CMP,TEST,AND,OR,XOR. bugref:10376

Location:

trunk/src/VBox/VMM/testcase

Files:

• tstIEMAImpl.cpp (modified) (13 diffs)
• tstIEMCheckMc.cpp (modified) (2 diffs)

trunk/src/VBox/VMM/testcase/tstIEMAImpl.cpp

@@ -1761 +1761 @@
             a_TestType Test; \
             Test.fEflIn    = RandEFlags(); \
-            Test.fEflOut   = Test.fEflIn; \
             Test.uDstIn    = RandU ## a_cBits ## Dst(iTest); \
             Test.uDstOut   = Test.uDstIn; \
@@ -1768 +1767 @@
                 Test.uSrcIn &= a_cBits - 1; /* Restrict bit index according to operand width */ \
             Test.uMisc     = 0; \
-            pfn(&Test.uDstOut, Test.uSrcIn, &Test.fEflOut); \
+            Test.fEflOut   = pfn(Test.fEflIn, &Test.uDstOut, Test.uSrcIn); \
             GenerateBinaryWrite(&BinOut, &Test, sizeof(Test)); \
         } \
@@ -1776 +1775 @@
             Test.fEflIn    = g_aBinU ## a_cBits[iFn].paFixedTests[iTest].fEflIn == UINT32_MAX ? RandEFlags() \
                            : g_aBinU ## a_cBits[iFn].paFixedTests[iTest].fEflIn; \
-            Test.fEflOut   = Test.fEflIn; \
             Test.uDstIn    = g_aBinU ## a_cBits[iFn].paFixedTests[iTest].uDstIn; \
             Test.uDstOut   = Test.uDstIn; \
             Test.uSrcIn    = g_aBinU ## a_cBits[iFn].paFixedTests[iTest].uSrcIn; \
             Test.uMisc     = g_aBinU ## a_cBits[iFn].paFixedTests[iTest].uMisc; \
-            pfn(&Test.uDstOut, Test.uSrcIn, &Test.fEflOut); \
+            Test.fEflOut   = pfn(Test.fEflIn, &Test.uDstOut, Test.uSrcIn); \
             GenerateBinaryWrite(&BinOut, &Test, sizeof(Test)); \
         } \
@@ -1818 +1816 @@
     cIterations /= 4; \
     RTThreadYield(); \
-    uint64_t const nsStart     = RTTimeNanoTS(); \
+    uint64_t const nsStart = RTTimeNanoTS(); \
     for (uint32_t i = 0; i < cIterations; i++) \
     { \
-        uint32_t fBenchEfl = fEflIn; \
-        a_uType  uBenchDst = uDstIn;  \
-        pfn(&uBenchDst, uSrcIn, &fBenchEfl); \
+        a_uType uBenchDst = uDstIn;  \
+        pfn(fEflIn, &uBenchDst, uSrcIn); \
         \
-        fBenchEfl = fEflIn; \
         uBenchDst = uDstIn;  \
-        pfn(&uBenchDst, uSrcIn, &fBenchEfl); \
+        pfn(fEflIn, &uBenchDst, uSrcIn); \
         \
-        fBenchEfl = fEflIn; \
         uBenchDst = uDstIn;  \
-        pfn(&uBenchDst, uSrcIn, &fBenchEfl); \
+        pfn(fEflIn, &uBenchDst, uSrcIn); \
         \
-        fBenchEfl = fEflIn; \
         uBenchDst = uDstIn;  \
-        pfn(&uBenchDst, uSrcIn, &fBenchEfl); \
+        pfn(fEflIn, &uBenchDst, uSrcIn); \
     } \
     return RTTimeNanoTS() - nsStart; \
@@ -1855 +1849 @@
             for (uint32_t iTest = 0; iTest < cTests; iTest++ ) \
             { \
-                uint32_t fEfl = paTests[iTest].fEflIn; \
                 a_uType  uDst = paTests[iTest].uDstIn; \
-                pfn(&uDst, paTests[iTest].uSrcIn, &fEfl); \
+                uint32_t fEfl = pfn(paTests[iTest].fEflIn, &uDst, paTests[iTest].uSrcIn); \
                 if (   uDst != paTests[iTest].uDstOut \
-                    || fEfl != paTests[iTest].fEflOut ) \
+                    || fEfl != paTests[iTest].fEflOut) \
                     RTTestFailed(g_hTest, "#%u%s: efl=%#08x dst=" a_Fmt " src=" a_Fmt " -> efl=%#08x dst=" a_Fmt ", expected %#08x & " a_Fmt "%s - %s\n", \
                                  iTest, !iVar ? "" : "/n", paTests[iTest].fEflIn, paTests[iTest].uDstIn, paTests[iTest].uSrcIn, \
@@ -1868 +1861 @@
                 { \
                      *g_pu ## a_cBits  = paTests[iTest].uDstIn; \
-                     *g_pfEfl = paTests[iTest].fEflIn; \
-                     pfn(g_pu ## a_cBits, paTests[iTest].uSrcIn, g_pfEfl); \
+                     fEfl = pfn(paTests[iTest].fEflIn, g_pu ## a_cBits, paTests[iTest].uSrcIn); \
                      RTTEST_CHECK(g_hTest, *g_pu ## a_cBits  == paTests[iTest].uDstOut); \
-                     RTTEST_CHECK(g_hTest, *g_pfEfl == paTests[iTest].fEflOut); \
+                     RTTEST_CHECK(g_hTest, fEfl == paTests[iTest].fEflOut); \
                 } \
             } \
@@ -1946 +1938 @@
     ENTRY_BIN_PFN_CAST(cmp_u16,   PFNIEMAIMPLBINU16),
     ENTRY_BIN_PFN_CAST(test_u16,  PFNIEMAIMPLBINU16),
+#if 0 /** @todo convert to new eflags format  */
     ENTRY_BIN_PFN_CAST_EX(bt_u16, PFNIEMAIMPLBINU16, 1),
     ENTRY_BIN_EX(btc_u16, 1),
@@ -1960 +1953 @@
     ENTRY_BIN_INTEL(imul_two_u16, X86_EFL_PF | X86_EFL_AF | X86_EFL_ZF | X86_EFL_SF),
     ENTRY_BIN(arpl),
+#endif
 };
 TEST_BINARY_OPS(16, uint16_t, "%#06x", BINU16_TEST_T, g_aBinU16)
@@ -1992 +1986 @@
     ENTRY_BIN_PFN_CAST(cmp_u32,   PFNIEMAIMPLBINU32),
     ENTRY_BIN_PFN_CAST(test_u32,  PFNIEMAIMPLBINU32),
+#if 0 /** @todo convert to new eflags format  */
     ENTRY_BIN_PFN_CAST_EX(bt_u32, PFNIEMAIMPLBINU32, 1),
     ENTRY_BIN_EX(btc_u32, 1),
@@ -2007 +2002 @@
     ENTRY_BIN(adcx_u32),
     ENTRY_BIN(adox_u32),
+#endif
 };
 TEST_BINARY_OPS(32, uint32_t, "%#010RX32", BINU32_TEST_T, g_aBinU32)
@@ -2039 +2035 @@
     ENTRY_BIN_PFN_CAST(cmp_u64,   PFNIEMAIMPLBINU64),
     ENTRY_BIN_PFN_CAST(test_u64,  PFNIEMAIMPLBINU64),
+#if 0 /** @todo convert to new eflags format  */
     ENTRY_BIN_PFN_CAST_EX(bt_u64, PFNIEMAIMPLBINU64, 1),
     ENTRY_BIN_EX(btc_u64, 1),
@@ -2054 +2051 @@
     ENTRY_BIN(adcx_u64),
     ENTRY_BIN(adox_u64),
+#endif
 };
 TEST_BINARY_OPS(64, uint64_t, "%#018RX64", BINU64_TEST_T, g_aBinU64)
@@ -2229 +2227 @@
                                  EFlagsDiff(fEfl, paTests[iTest].fEflOut)); \
                 /* positive */ \
-                uint32_t fEflExpect = paTests[iTest].fEflIn; \
                 uA                  = paTests[iTest].uDstIn; \
-                s_aFuncs[iFn].pfnSub(&uA, uA, &fEflExpect); \
+                uint32_t fEflExpect = s_aFuncs[iFn].pfnSub(paTests[iTest].fEflIn, &uA, uA); \
                 fEfl                = paTests[iTest].fEflIn; \
                 uA                  = paTests[iTest].uDstIn; \

trunk/src/VBox/VMM/testcase/tstIEMCheckMc.cpp

@@ -662 +662 @@
     uint32_t *a_pName = &a_Name; \
     NOREF(a_pName)
+#define IEM_MC_ARG_EFLAGS(a_Name, a_iArg) IEM_MC_ARG(uint32_t, a_Name, a_iArg); IEM_MC_FETCH_EFLAGS(a_Name)
 
 #define IEM_MC_COMMIT_EFLAGS(a_EFlags)                  do { CHK_TYPE(uint32_t, a_EFlags); (void)fMcBegin; } while (0)
@@ -1002 +1003 @@
 #define IEM_MC_CALL_VOID_AIMPL_4(a_pfn, a0, a1, a2, a3) \
     do { CHK_CALL_ARG(a0, 0); CHK_CALL_ARG(a1, 1); CHK_CALL_ARG(a2, 2); CHK_CALL_ARG(a3, 3); (void)fMcBegin; } while (0)
-#define IEM_MC_CALL_AIMPL_3(a_rc, a_pfn, a0, a1, a2) \
+#define IEM_MC_CALL_AIMPL_3(a_rcType, a_rc, a_pfn, a0, a1, a2) \
+    IEM_MC_LOCAL(a_rcType, a_rc); \
     do { CHK_CALL_ARG(a0, 0); CHK_CALL_ARG(a1, 1); CHK_CALL_ARG(a2, 2);  (a_rc) = VINF_SUCCESS; (void)fMcBegin; } while (0)
-#define IEM_MC_CALL_AIMPL_4(a_rc, a_pfn, a0, a1, a2, a3) \
+#define IEM_MC_CALL_AIMPL_4(a_rcType, a_rc, a_pfn, a0, a1, a2, a3) \
+    IEM_MC_LOCAL(a_rcType, a_rc); \
     do { CHK_CALL_ARG(a0, 0); CHK_CALL_ARG(a1, 1); CHK_CALL_ARG(a2, 2); CHK_CALL_ARG(a3, 3);  (a_rc) = VINF_SUCCESS; (void)fMcBegin; } while (0)
 #define IEM_MC_CALL_CIMPL_0(a_fFlags, a_fGstShwFlush, a_pfnCImpl)                       do { (void)fMcBegin; } while (0)