VirtualBox

Ignore:
Timestamp:
Nov 30, 2015 10:45:51 PM (9 years ago)
Author:
vboxsync
Message:

ValidationKit/UsbTest: Modify the parameters for the Control Writes test or it will fail due to some parameter checking in the usbtest kernel module.

File:
1 edited

Legend:

Unmodified
Added
Removed

  • trunk/src/VBox/ValidationKit/utils/usb/UsbTest.cpp

    r58907 r58930  
    108108#define USBTEST_REQUEST _IOWR('U', 100, USBTESTPARMS)
    109109
     110/**
     111 * Callback to set up the test parameters for a specific test.
     112 *
     113 * @returns IPRT status code.
     114 * @retval  VINF_SUCCESS    if setting the parameters up succeeded. Any other error code
     115 *                          otherwise indicating the kind of error.
     116 * @param   idxTest         The test index.
     117 * @param   pszTest         Test name.
     118 * @param   pParams         The USB test parameters to set up.
     119 */
     120typedef DECLCALLBACK(int) FNUSBTESTPARAMSSETUP(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
     121/** Pointer to a USB test parameters setup callback. */
     122typedef FNUSBTESTPARAMSSETUP *PFNUSBTESTPARAMSSETUP;
     123
     124/**
     125 * USB test descriptor.
     126 */
     127typedef struct USBTESTDESC
     128{
     129    /** (Sort of) Descriptive test name. */
     130    const char           *pszName;
     131    /** Flag whether the test is excluded. */
     132    bool                  fExcluded;
     133    /** The parameter setup callback. */
     134    PFNUSBTESTPARAMSSETUP pfnParamsSetup;
     135} USBTESTDESC;
     136/** Pointer a USB test descriptor. */
     137typedef USBTESTDESC *PUSBTESTDESC;
    110138
    111139/*********************************************************************************************************************************
    112140*   Global Variables                                                                                                             *
    113141*********************************************************************************************************************************/
     142
     143/** Some forward method declarations. */
     144static DECLCALLBACK(int) usbTestParamsSetupReadWrite(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
     145static DECLCALLBACK(int) usbTestParamsSetupControlWrites(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams);
    114146
    115147/** Command line parameters */
    … …  
    121153};
    122154
    123 /**
    124  * USB test descriptor.
    125  */
    126 typedef struct USBTESTDESC
    127 {
    128     /** (Sort of) Descriptive test name. */
    129     const char *pszName;
    130     /** Flag whether the test is excluded. */
    131     bool        fExcluded;
    132 } USBTESTDESC;
    133 /** Pointer a USB test descriptor. */
    134 typedef USBTESTDESC *PUSBTESTDESC;
    135 
    136155static USBTESTDESC g_aTests[] =
    137156{
    138     /* pszTest                             fExcluded */
    139     {"NOP",                                false},
    140     {"Non-queued Bulk write",              false},
    141     {"Non-queued Bulk read",               false},
    142     {"Non-queued Bulk write variabe size", false},
    143     {"Non-queued Bulk read variabe size",  false},
    144     {"Queued Bulk write",                  false},
    145     {"Queued Bulk read",                   false},
    146     {"Queued Bulk write variabe size",     false},
    147     {"Queued Bulk read variabe size",      false},
    148     {"Chapter 9 Control Test",             false},
    149     {"Queued control messaging",           false},
    150     {"Unlink reads",                       false},
    151     {"Unlink writes",                      false},
    152     {"Set/Clear halts",                    false},
    153     {"Control writes",                     false},
    154     {"Isochronous write",                  false},
    155     {"Isochronous read",                   false},
    156     {"Bulk write unaligned (DMA)",         false},
    157     {"Bulk read unaligned (DMA)",          false},
    158     {"Bulk write unaligned (no DMA)",      false},
    159     {"Bulk read unaligned (no DMA)",       false},
    160     {"Control writes unaligned",           false},
    161     {"Isochronous write unaligned",        false},
    162     {"Isochronous read unaligned",         false},
    163     {"Unlink queued Bulk",                 false}
     157    /* pszTest                             fExcluded      pfnParamsSetup */
     158    {"NOP",                                false,         usbTestParamsSetupReadWrite},
     159    {"Non-queued Bulk write",              false,         usbTestParamsSetupReadWrite},
     160    {"Non-queued Bulk read",               false,         usbTestParamsSetupReadWrite},
     161    {"Non-queued Bulk write variabe size", false,         usbTestParamsSetupReadWrite},
     162    {"Non-queued Bulk read variabe size",  false,         usbTestParamsSetupReadWrite},
     163    {"Queued Bulk write",                  false,         usbTestParamsSetupReadWrite},
     164    {"Queued Bulk read",                   false,         usbTestParamsSetupReadWrite},
     165    {"Queued Bulk write variabe size",     false,         usbTestParamsSetupReadWrite},
     166    {"Queued Bulk read variabe size",      false,         usbTestParamsSetupReadWrite},
     167    {"Chapter 9 Control Test",             false,         usbTestParamsSetupReadWrite},
     168    {"Queued control messaging",           false,         usbTestParamsSetupReadWrite},
     169    {"Unlink reads",                       false,         usbTestParamsSetupReadWrite},
     170    {"Unlink writes",                      false,         usbTestParamsSetupReadWrite},
     171    {"Set/Clear halts",                    false,         usbTestParamsSetupReadWrite},
     172    {"Control writes",                     false,         usbTestParamsSetupControlWrites},
     173    {"Isochronous write",                  false,         usbTestParamsSetupReadWrite},
     174    {"Isochronous read",                   false,         usbTestParamsSetupReadWrite},
     175    {"Bulk write unaligned (DMA)",         false,         usbTestParamsSetupReadWrite},
     176    {"Bulk read unaligned (DMA)",          false,         usbTestParamsSetupReadWrite},
     177    {"Bulk write unaligned (no DMA)",      false,         usbTestParamsSetupReadWrite},
     178    {"Bulk read unaligned (no DMA)",       false,         usbTestParamsSetupReadWrite},
     179    {"Control writes unaligned",           false,         usbTestParamsSetupControlWrites},
     180    {"Isochronous write unaligned",        false,         usbTestParamsSetupReadWrite},
     181    {"Isochronous read unaligned",         false,         usbTestParamsSetupReadWrite},
     182    {"Unlink queued Bulk",                 false,         usbTestParamsSetupReadWrite}
    164183};
    165184
    … …  
    167186static RTTEST g_hTest;
    168187
    169 
     188/**
     189 * Setup callback for basic read/write (bulk, isochronous) tests.
     190 *
     191 * @copydoc FNUSBTESTPARAMSSETUP
     192 */
     193static DECLCALLBACK(int) usbTestParamsSetupReadWrite(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams)
     194{
     195    NOREF(idxTest);
     196    NOREF(pszTest);
     197
     198    pParams->cIterations = 1000;
     199    pParams->cbData = 512;
     200    pParams->cbVariation = 512;
     201    pParams->cSgLength = 32;
     202
     203    return VINF_SUCCESS;
     204}
     205
     206/**
     207 * Setup callback for the control writes test.
     208 *
     209 * @copydoc FNUSBTESTPARAMSSETUP
     210 */
     211static DECLCALLBACK(int) usbTestParamsSetupControlWrites(unsigned idxTest, const char *pszTest, PUSBTESTPARAMS pParams)
     212{
     213    NOREF(idxTest);
     214    NOREF(pszTest);
     215
     216    pParams->cIterations = 1000;
     217    pParams->cbData = 512;
     218    /*
     219     * Must be smaller than cbData or the parameter check in the usbtest module fails,
     220     * no idea yet why it must be this.
     221     */
     222    pParams->cbVariation = 256;
     223    pParams->cSgLength = 32;
     224
     225    return VINF_SUCCESS;
     226}
     227
     228/**
     229 * Shows tool usage text.
     230 */
    170231static void usbTestUsage(PRTSTREAM pStrm)
    171232{
    … …  
    292353        RTTestPassed(g_hTest, "Opening device successful\n");
    293354
    294         /*
    295          * Fill params with some defaults.
    296          * @todo: Make them configurable.
    297          */
    298         Params.cIterations = 1000;
    299         Params.cbData = 512;
    300         Params.cbVariation = 512;
    301         Params.cSgLength = 32;
    302 
    303355        for (unsigned i = 0; i < RT_ELEMENTS(g_aTests); i++)
    304356        {
    … …  
    311363            }
    312364
    313             Params.idxTest = i;
    314 
    315             /* Assume the test interface has the number 0 for now. */
    316             int rcPosix = usbTestIoctl(iDevFd, 0, &Params);
    317             if (rcPosix < 0 && errno == EOPNOTSUPP)
     365            int rc = g_aTests[i].pfnParamsSetup(i, g_aTests[i].pszName, &Params);
     366            if (RT_SUCCESS(rc))
    318367            {
    319                 RTTestSkipped(g_hTest, "Not supported");
    320                 continue;
     368                Params.idxTest = i;
     369
     370                /* Assume the test interface has the number 0 for now. */
     371                int rcPosix = usbTestIoctl(iDevFd, 0, &Params);
     372                if (rcPosix < 0 && errno == EOPNOTSUPP)
     373                {
     374                    RTTestSkipped(g_hTest, "Not supported");
     375                    continue;
     376                }
     377
     378                if (rcPosix < 0)
     379                    RTTestFailed(g_hTest, "Test failed with %Rrc\n", RTErrConvertFromErrno(errno));
     380                else
     381                {
     382                    uint64_t u64Ns = Params.TimeTest.tv_sec * RT_NS_1SEC + Params.TimeTest.tv_usec * RT_NS_1US;
     383                    RTTestValue(g_hTest, "Runtime", u64Ns, RTTESTUNIT_NS);
     384                }
    321385            }
    322 
    323             if (rcPosix < 0)
    324                 RTTestFailed(g_hTest, "Test failed with %Rrc\n", RTErrConvertFromErrno(errno));
    325386            else
    326             {
    327                 uint64_t u64Ns = Params.TimeTest.tv_sec * RT_NS_1SEC + Params.TimeTest.tv_usec * RT_NS_1US;
    328                 RTTestValue(g_hTest, "Runtime", u64Ns, RTTESTUNIT_NS);
    329             }
     387                RTTestFailed(g_hTest, "Setting up test parameters failed with %Rrc\n", rc);
    330388            RTTestSubDone(g_hTest);
    331389        }
    … …  
    370428                else
    371429                {
    372                     RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Failed to find a test device\n");
     430                    RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Invalid test number passed to --exclude\n");
    373431                    RTTestErrorInc(g_hTest);
    374432                    return RTGetOptPrintError(VERR_INVALID_PARAMETER, &ValueUnion);
    … …  
    387445    /* Find the first test device if none was given. */
    388446    if (!pszDevice)
     447    {
     448        RTTestSub(g_hTest, "Detecting device");
    389449        pszDevice = usbTestFindDevice();
     450        if (!pszDevice)
     451            RTTestFailed(g_hTest, "Failed to find suitable device\n");
     452
     453        RTTestSubDone(g_hTest);
     454    }
    390455
    391456    if (pszDevice)
    392457        usbTestExec(pszDevice);
    393     else
    394     {
    395         RTTestPrintf(g_hTest, RTTESTLVL_FAILURE, "Failed to find a test device\n");
    396         RTTestErrorInc(g_hTest);
    397     }
    398458
    399459    RTEXITCODE rcExit = RTTestSummaryAndDestroy(g_hTest);
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